The transmission electron microscope (TEM) is a very powerful instrument for material science. A high energy beam of electrons is penetrating through a very thin sample, and the interactions between the electrons and the atoms can be used to observe features such as crystal structure and features in the structure like lattice plane, dislocations and grain boundaries. Elemental analysis can also be performed simultaneously. TEM can be used to study the growth of layers, elemental composition and defects in crystalline materials. The analysis not only can be done while observation but more of the analysis can make by using off-line software. This make post-analysis TEM very important. With this workshop, participant will be teaching how to interpret the data by using off-line software.
The main topics covered in this workshop include:
1) Theory of TEM & EDX
2) Post analysis of TEM & EDX
3) Post analysis of Diffraction
4) How to present good TEM data in thesis.
For more details about the workshop can be found in the brochure as attached.
For more information, please contact:
Norshilyla Jailani +607-5610267 / norshilyla@utm.my
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